On November 3, 2026, CIQTEK hosted an electron microscopy seminar at a university in California, bringing researchers together for a practical discussion on SEM technology, FIB, high-speed imaging, and the future of integrated characterization.
The seminar brought together researchers and microscopy users, with lively discussion around SEM technology, applications, and future workflows. Rather than focusing only on instrument specifications, the conversation explored how microscopy is evolving around real research needs and more efficient ways of working.
From SEM Imaging to Integrated Characterization
One of the main themes was the changing role of the scanning electron microscope.
SEM is no longer only an imaging tool. New workflows increasingly combine high-resolution imaging, sample preparation, analysis, and other characterization methods into a more connected platform.
The seminar also explored how FIB and SEM technologies can work together in applications that require site-specific preparation, cross-sectioning, and deeper structural analysis.
For researchers, the focus is on how these technologies can support real applications and deliver practical value in microscopy workflows.
Faster Imaging with High-Speed SEM
Another topic was HEM, or High-Speed SEM, one of CIQTEK's recent developments in electron microscopy.
The technology is designed to increase image acquisition speed while maintaining high-resolution imaging. CIQTEK shared how faster acquisition can support workflows where large amounts of image data need to be collected efficiently.
This can be especially useful in applications involving large-area imaging, repeated measurements, or high-throughput characterization.
Continuing the Conversation
For CIQTEK, events like this are not only a way to introduce new technology. They are also a chance to hear directly from researchers and better understand how electron microscopy is being used in real laboratories.
CIQTEK plans to continue organizing more technical seminars and research exchanges across the United States.
If you are interested in hosting a similar seminar or learning more about CIQTEK electron microscopy solutions, feel free to contact our U.S. team.
